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Process-induced degradation of SiO2 and a-Si:H passivation layers for photovoltaic applications

dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorBearda, Twan
dc.contributor.authorNadupalli, Shankari
dc.contributor.authorLabie, Riet
dc.contributor.authorBaert, Kris
dc.contributor.authorGordon, Ivan
dc.contributor.authorPoortmans, Jef
dc.date.accessioned2021-10-22T04:30:48Z
dc.date.available2021-10-22T04:30:48Z
dc.date.issued2014
dc.identifier.issn2156-3381
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24353
dc.sourceIIOimport
dc.titleProcess-induced degradation of SiO2 and a-Si:H passivation layers for photovoltaic applications
dc.typeJournal article
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorLabie, Riet
dc.contributor.imecauthorGordon, Ivan
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecLabie, Riet::0000-0002-1401-1291
dc.contributor.orcidimecGordon, Ivan::0000-0002-0713-8403
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1197
dc.source.endpage1203
dc.source.journalIEEE Journal of Photovoltaics
dc.source.issue5
dc.source.volume4
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6834759&queryText%3DProcess+induced+degradation+of+SiO2+and+a-Si%
imec.availabilityPublished - open access


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