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Atomistic pseudo-transient BTI simulation with inherent workload memory

dc.contributor.authorRodopoulos, D.
dc.contributor.authorWeckx, Pieter
dc.contributor.authorNoltsis, M.
dc.contributor.authorCatthoor, Francky
dc.contributor.authorSoudris, D.
dc.date.accessioned2021-10-22T05:10:36Z
dc.date.available2021-10-22T05:10:36Z
dc.date.issued2014
dc.identifier.issn1530-4388
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24442
dc.sourceIIOimport
dc.titleAtomistic pseudo-transient BTI simulation with inherent workload memory
dc.typeJournal article
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage704
dc.source.endpage714
dc.source.journalIEEE Transactions on Device and Materials Reliability
dc.source.issue2
dc.source.volume14
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6780572&sortType%3Ddesc_p_Publication_Year%26queryText%3Dcatthoor
imec.availabilityPublished - open access


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