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Noise as a diagnostic device tool for semiconductor material and device characterization

dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-09-30T11:34:41Z
dc.date.available2021-09-30T11:34:41Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2450
dc.sourceIIOimport
dc.titleNoise as a diagnostic device tool for semiconductor material and device characterization
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage2058
dc.source.endpage2067
dc.source.journalJournal of the Electrochemical Society
dc.source.issue6
dc.source.volume145
imec.availabilityPublished - open access


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