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Assessment of the impact of inelastic tunneling on the frequency-depth conversion from low-frequency noise spectra

dc.contributor.authorSimoen, Eddy
dc.contributor.authorLee, Jae Woo
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-22T05:52:19Z
dc.date.available2021-10-22T05:52:19Z
dc.date.issued2014
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24530
dc.sourceIIOimport
dc.titleAssessment of the impact of inelastic tunneling on the frequency-depth conversion from low-frequency noise spectra
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage634
dc.source.endpage637
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue2
dc.source.volume61
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6702481&queryText%3DAssessment+of+the+impact+of+inelastic+tunneli
imec.availabilityPublished - open access


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