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Impact of field-induced quantum confinement on the onset of tunneling field-effect transistors: Experimental verification

dc.contributor.authorSmets, Quentin
dc.contributor.authorVerhulst, Anne
dc.contributor.authorMartens, Koen
dc.contributor.authorLin, Dennis
dc.contributor.authorEl Kazzi, Salim
dc.contributor.authorVerreck, Devin
dc.contributor.authorSimoen, Eddy
dc.contributor.authorCollaert, Nadine
dc.contributor.authorThean, Aaron
dc.contributor.authorRaskin, Jean-Pierre
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-22T05:58:58Z
dc.date.available2021-10-22T05:58:58Z
dc.date.issued2014
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24543
dc.sourceIIOimport
dc.titleImpact of field-induced quantum confinement on the onset of tunneling field-effect transistors: Experimental verification
dc.typeJournal article
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorVerreck, Devin
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorThean, Aaron
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecVerreck, Devin::0000-0002-3833-5880
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage203507
dc.source.journalApplied Physics Letters
dc.source.issue20
dc.source.volume150
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/apl/105/20/10.1063/1.4902117
imec.availabilityPublished - open access


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