Show simple item record

Parasitic conduction response to X-ray radiation in unstrained and strained triple-gate SOI MuGFETs

dc.contributor.authorTeixeira, Fernando
dc.contributor.authorBordallo, Caio
dc.contributor.authorSilveira, Marcilei
dc.contributor.authorAgopian, Paula
dc.contributor.authorMartino, Joao
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-22T06:30:22Z
dc.date.available2021-10-22T06:30:22Z
dc.date.issued2014
dc.identifier.issn1807-1953
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24608
dc.sourceIIOimport
dc.titleParasitic conduction response to X-ray radiation in unstrained and strained triple-gate SOI MuGFETs
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage97
dc.source.endpage102
dc.source.journalJournal of Integrated Circuits and Systems
dc.source.issue2
dc.source.volume9
dc.identifier.urlhttp://www.sbmicro.org.br/jics/html/artigos/vol9no2/3.pdf
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
30092.pdf
Size:
718.9Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record