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dc.contributor.authorTsigkourakos, Menelaos
dc.contributor.authorHantschel, Thomas
dc.contributor.authorBangerter, Christophe
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-22T06:43:19Z
dc.date.available2021-10-22T06:43:19Z
dc.date.issued2014
dc.identifier.issn1862-6300
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24634
dc.sourceIIOimport
dc.titleElectrical probing of B-doped diamond seeds embedded into the interfacial layer of a conductive diamond film
dc.typeJournal article
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.source.peerreviewyes
dc.source.beginpage2284
dc.source.endpage2289
dc.source.journalPhysica Status Solidi A
dc.source.issue10
dc.source.volume211
dc.identifier.urlhttp://onlinelibrary.wiley.com/doi/10.1002/pssa.201431215/abstract
imec.availabilityPublished - imec


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