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P-N junction peripheral current analysis using gated diode measurements

dc.contributor.authorCzerwinski, A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-30T11:37:53Z
dc.date.available2021-09-30T11:37:53Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2470
dc.sourceIIOimport
dc.titleP-N junction peripheral current analysis using gated diode measurements
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage3503
dc.source.endpage3505
dc.source.journalApplied Physics Letters
dc.source.issue26
dc.source.volume72
imec.availabilityPublished - open access


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