Show simple item record

Stress induced leakage current in thin oxides and its impact on flash memory reliability

dc.contributor.authorDe Blauwe, Jan
dc.date.accessioned2021-09-30T11:38:58Z
dc.date.available2021-09-30T11:38:58Z
dc.date.issued1998-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2477
dc.sourceIIOimport
dc.titleStress induced leakage current in thin oxides and its impact on flash memory reliability
dc.typePHD thesis
dc.source.peerreviewno
imec.availabilityPublished - imec
imec.internalnotesThesis Advisor : Prof. Dr. Ir. H. Maes


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record