dc.contributor.author | De Blauwe, Jan | |
dc.contributor.author | Van Houdt, Jan | |
dc.contributor.author | Wellekens, Dirk | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Maes, Herman | |
dc.date.accessioned | 2021-09-30T11:39:09Z | |
dc.date.available | 2021-09-30T11:39:09Z | |
dc.date.issued | 1998 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2478 | |
dc.source | IIOimport | |
dc.title | SILC-related effects in flash E2PROM's - Part I: A quantitative model for steady-state SILC | |
dc.type | Journal article | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.imecauthor | Wellekens, Dirk | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 1745 | |
dc.source.endpage | 1750 | |
dc.source.journal | IEEE Trans. Electron Devices | |
dc.source.issue | 8 | |
dc.source.volume | 45 | |
imec.availability | Published - open access | |