dc.contributor.author | De Blauwe, Jan | |
dc.contributor.author | Van Houdt, Jan | |
dc.contributor.author | Wellekens, Dirk | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Maes, Herman | |
dc.date.accessioned | 2021-09-30T11:39:19Z | |
dc.date.available | 2021-09-30T11:39:19Z | |
dc.date.issued | 1998 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2479 | |
dc.source | IIOimport | |
dc.title | SILC-related effects in flash E2PROM's - Part II: Prediction of steady-state SILC-related disturb characteristics | |
dc.type | Journal article | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.imecauthor | Wellekens, Dirk | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.source.peerreview | no | |
dc.source.beginpage | 1751 | |
dc.source.endpage | 1760 | |
dc.source.journal | IEEE Trans. Electron Devices | |
dc.source.issue | 8 | |
dc.source.volume | 45 | |
imec.availability | Published - imec | |