dc.contributor.author | Walke, Amey | |
dc.contributor.author | Vandooren, Anne | |
dc.contributor.author | Rooyackers, Rita | |
dc.contributor.author | Leonelli, Daniele | |
dc.contributor.author | Hikavyy, Andriy | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | Verhulst, Anne | |
dc.contributor.author | Kao, Frank | |
dc.contributor.author | Huyghebaert, Cedric | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Rao, V. Ramgopal | |
dc.contributor.author | Bhuwalka, Krishna Kumar | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Thean, Aaron | |
dc.date.accessioned | 2021-10-22T08:09:05Z | |
dc.date.available | 2021-10-22T08:09:05Z | |
dc.date.issued | 2014 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/24802 | |
dc.source | IIOimport | |
dc.title | Fabrication and analysis of a Si/Si0.55Ge0.45 hetero-junction line tunnel FET | |
dc.type | Journal article | |
dc.contributor.imecauthor | Walke, Amey | |
dc.contributor.imecauthor | Vandooren, Anne | |
dc.contributor.imecauthor | Leonelli, Daniele | |
dc.contributor.imecauthor | Hikavyy, Andriy | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Verhulst, Anne | |
dc.contributor.imecauthor | Kao, Frank | |
dc.contributor.imecauthor | Huyghebaert, Cedric | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.orcidimec | Vandooren, Anne::0000-0002-2412-0176 | |
dc.contributor.orcidimec | Hikavyy, Andriy::0000-0002-8201-075X | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | Verhulst, Anne::0000-0002-3742-9017 | |
dc.contributor.orcidimec | Huyghebaert, Cedric::0000-0001-6043-7130 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 707 | |
dc.source.endpage | 715 | |
dc.source.journal | IEEE Transactions on Electron Devices | |
dc.source.issue | 3 | |
dc.source.volume | 61 | |
dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6727530&queryText%3DFabrication+and+Analysis+of+a+Si%2FSi0.55Ge0. | |
imec.availability | Published - open access | |