Show simple item record

Implications of BTI-induced time-dependent statistics on yield estimation of digital circuits

dc.contributor.authorWeckx, Pieter
dc.contributor.authorKaczer, Ben
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorFranco, Jacopo
dc.contributor.authorRoussel, Philippe
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-10-22T08:12:47Z
dc.date.available2021-10-22T08:12:47Z
dc.date.issued2014
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24809
dc.sourceIIOimport
dc.titleImplications of BTI-induced time-dependent statistics on yield estimation of digital circuits
dc.typeJournal article
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage666
dc.source.endpage673
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue3
dc.source.volume61
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6719591
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
31832.pdf
Size:
943.0Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record