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dc.contributor.authorXu, XiuMei
dc.contributor.authorVereecke, Guy
dc.contributor.authorChen, Chang
dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorArmini, Silvia
dc.contributor.authorVerellen, Niels
dc.contributor.authortsai, Wei-Kang
dc.contributor.authorKim, Dong-Wook
dc.contributor.authorLee, Eunsongyi
dc.contributor.authorLin, Chang-You
dc.contributor.authorVan Dorpe, Pol
dc.contributor.authorStruyf, Herbert
dc.contributor.authorHolsteyns, Frank
dc.contributor.authorMoshchalkov, Victor
dc.contributor.authorindekeu, joseph
dc.contributor.authorDe Gendt, Stefan
dc.date.accessioned2021-10-22T08:36:55Z
dc.date.available2021-10-22T08:36:55Z
dc.date.issued2014
dc.identifier.issn1936-0851
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24853
dc.sourceIIOimport
dc.titleCapturing wetting states in nanopatterned silicon
dc.typeJournal article
dc.contributor.imecauthorXu, XiuMei
dc.contributor.imecauthorVereecke, Guy
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorArmini, Silvia
dc.contributor.imecauthorVerellen, Niels
dc.contributor.imecauthorVan Dorpe, Pol
dc.contributor.imecauthorStruyf, Herbert
dc.contributor.imecauthorHolsteyns, Frank
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.orcidimecXu, XiuMei::0000-0002-3356-8693
dc.contributor.orcidimecVereecke, Guy::0000-0001-9058-9338
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecArmini, Silvia::0000-0003-0578-3422
dc.contributor.orcidimecVerellen, Niels::0000-0001-5110-4158
dc.contributor.orcidimecVan Dorpe, Pol::0000-0003-0918-1664
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.source.peerreviewyes
dc.source.beginpage855
dc.source.endpage893
dc.source.journalACS Nano
dc.source.issue1
dc.source.volume8
dc.identifier.urlhttps://pubs.acs.org/doi/abs/10.1021/nn405621w
imec.availabilityPublished - imec


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