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dc.contributor.authorBan, Yu
dc.contributor.authorDe Keulenaer, Timothy
dc.contributor.authorLi, Zhisheng
dc.contributor.authorVan Kerrebrouck, Joris
dc.contributor.authorSinsky, J.F.
dc.contributor.authorKozicki, B.
dc.contributor.authorBauwelinck, Johan
dc.contributor.authorTorfs, Guy
dc.date.accessioned2021-10-22T18:31:43Z
dc.date.available2021-10-22T18:31:43Z
dc.date.issued2015-11
dc.identifier.issn1531-1309
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24967
dc.sourceIIOimport
dc.titleA wide-band, 5-tap transversal filter with improved testability for equalization up to 84 Gb/s
dc.typeJournal article
dc.contributor.imecauthorVan Kerrebrouck, Joris
dc.contributor.imecauthorBauwelinck, Johan
dc.contributor.imecauthorTorfs, Guy
dc.contributor.orcidimecVan Kerrebrouck, Joris::0000-0002-6611-7979
dc.contributor.orcidimecBauwelinck, Johan::0000-0001-5254-2408
dc.contributor.orcidimecTorfs, Guy::0000-0003-1817-5370
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage739
dc.source.endpage741
dc.source.journalIEEE Microwave and Wireless Components Letters
dc.source.issue11
dc.source.volume25
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7287794
imec.availabilityPublished - open access


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