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Evaluation of the electrical contact area in contact-mode scanning probe microscopy

dc.contributor.authorCelano, Umberto
dc.contributor.authorHantschel, Thomas
dc.contributor.authorGiammaria, Guido
dc.contributor.authorChintala, Ravi Chandra
dc.contributor.authorConard, Thierry
dc.contributor.authorBender, Hugo
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-22T18:37:50Z
dc.date.available2021-10-22T18:37:50Z
dc.date.issued2015
dc.identifier.issn0021-8979
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25043
dc.sourceIIOimport
dc.titleEvaluation of the electrical contact area in contact-mode scanning probe microscopy
dc.typeJournal article
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage214305
dc.source.journalJournal of Applied Physics
dc.source.issue21
dc.source.volume117
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/jap/117/21/10.1063/1.4921878
imec.availabilityPublished - open access


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