Time dependent dielectric breakdown in thin oxides: mechanisms, statistics and oxide reliability prediction
| dc.contributor.author | Degraeve, Robin | |
| dc.date.accessioned | 2021-09-30T11:47:24Z | |
| dc.date.available | 2021-09-30T11:47:24Z | |
| dc.date.issued | 1998-05 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2524 | |
| dc.source | IIOimport | |
| dc.title | Time dependent dielectric breakdown in thin oxides: mechanisms, statistics and oxide reliability prediction | |
| dc.type | PHD thesis | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.source.peerreview | no | |
| imec.availability | Published - imec | |
| imec.internalnotes | Thesis Advisors : Prof. Dr. Ir. H. Maes |
Files in this item
| Files | Size | Format | View |
|---|---|---|---|
|
There are no files associated with this item. |
|||