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Mapping interfacial excess in atom probe data

dc.contributor.authorFelfer, Peter
dc.contributor.authorScherrer, Barbara
dc.contributor.authorDemeulemeester, Jelle
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorCairney, Julie M.
dc.date.accessioned2021-10-22T19:14:17Z
dc.date.available2021-10-22T19:14:17Z
dc.date.issued2015
dc.identifier.issn0304-3991
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25267
dc.sourceIIOimport
dc.titleMapping interfacial excess in atom probe data
dc.typeJournal article
dc.contributor.imecauthorVandervorst, Wilfried
dc.source.peerreviewyes
dc.source.beginpage438
dc.source.endpage444
dc.source.journalUltramicroscopy
dc.source.issuePart B
dc.source.volume159
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S0304399115001369
imec.availabilityPublished - imec


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