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Extended X-ray absorption fine structure investigation of Sn local environment in strained and relaxed epitaxial Ge1-xSnx films

dc.contributor.authorGencarelli, Federica
dc.contributor.authorGrandjean, Didier
dc.contributor.authorShimura, Yosuke
dc.contributor.authorVincent, Benjamin
dc.contributor.authorBanerjee, Dipanjan
dc.contributor.authorVantomme, Andre
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorLoo, Roger
dc.contributor.authorHeyns, Marc
dc.contributor.authorTemst, Kristiaan
dc.date.accessioned2021-10-22T19:21:42Z
dc.date.available2021-10-22T19:21:42Z
dc.date.issued2015
dc.identifier.issn0021-8979
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25301
dc.sourceIIOimport
dc.titleExtended X-ray absorption fine structure investigation of Sn local environment in strained and relaxed epitaxial Ge1-xSnx films
dc.typeJournal article
dc.contributor.imecauthorVincent, Benjamin
dc.contributor.imecauthorVantomme, Andre
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorTemst, Kristiaan
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage95702
dc.source.journalJournal of Applied Physics
dc.source.issue9
dc.source.volume117
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/jap/117/9/10.1063/1.4913856
imec.availabilityPublished - open access


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