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Current transient spectroscopy for trapping analysis on Au-free AlGaN/GaN Schottky barrier diode

dc.contributor.authorHu, Jie
dc.contributor.authorStoffels, Steve
dc.contributor.authorLenci, Silvia
dc.contributor.authorBakeroot, Benoit
dc.contributor.authorVenegas, Rafael
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-22T19:45:59Z
dc.date.available2021-10-22T19:45:59Z
dc.date.issued2015
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25398
dc.sourceIIOimport
dc.titleCurrent transient spectroscopy for trapping analysis on Au-free AlGaN/GaN Schottky barrier diode
dc.typeJournal article
dc.contributor.imecauthorStoffels, Steve
dc.contributor.imecauthorLenci, Silvia
dc.contributor.imecauthorBakeroot, Benoit
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecBakeroot, Benoit::0000-0003-4392-1777
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewyes
dc.source.beginpage83502
dc.source.journalApplied Physics Letters
dc.source.issue8
dc.source.volume106
dc.identifier.urlhttp://dx.doi.org/10.1063/1.4913575
imec.availabilityPublished - imec


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