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Investigation of constant voltage off-state stress on Au-free AlGaN/GaN Schottky barrier diodes

dc.contributor.authorHu, Jie
dc.contributor.authorStoffels, Steve
dc.contributor.authorLenci, Silvia
dc.contributor.authorWu, Tian-Li
dc.contributor.authorRonchi, Nicolo
dc.contributor.authorYou, Shuzhen
dc.contributor.authorBakeroot, Benoit
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-22T19:46:16Z
dc.date.available2021-10-22T19:46:16Z
dc.date.issued2015
dc.identifier.issn0021-4922
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25399
dc.sourceIIOimport
dc.titleInvestigation of constant voltage off-state stress on Au-free AlGaN/GaN Schottky barrier diodes
dc.typeJournal article
dc.contributor.imecauthorStoffels, Steve
dc.contributor.imecauthorLenci, Silvia
dc.contributor.imecauthorRonchi, Nicolo
dc.contributor.imecauthorYou, Shuzhen
dc.contributor.imecauthorBakeroot, Benoit
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecRonchi, Nicolo::0000-0002-7961-4077
dc.contributor.orcidimecBakeroot, Benoit::0000-0003-4392-1777
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewyes
dc.source.beginpage04DF07
dc.source.journalJapanese Journal of Applied Physics
dc.source.issue4S
dc.source.volume54
dc.identifier.urlhttp://iopscience.iop.org/1347-4065/54/4S/04DF07
imec.availabilityPublished - imec


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