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Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatique reliability

dc.contributor.authorJablonski, Michal
dc.contributor.authorLucchini, R.
dc.contributor.authorBossuyt, Frederick
dc.contributor.authorVervust, Thomas
dc.contributor.authorVanfleteren, Jan
dc.contributor.authorDe Vries, J.W.C.
dc.contributor.authorVena, P.
dc.contributor.authorGonzalez, Mario
dc.date.accessioned2021-10-22T19:52:17Z
dc.date.available2021-10-22T19:52:17Z
dc.date.issued2015
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25420
dc.sourceIIOimport
dc.titleImpact of geometry on stretchable meandered interconnect uniaxial tensile extension fatique reliability
dc.typeJournal article
dc.contributor.imecauthorBossuyt, Frederick
dc.contributor.imecauthorVervust, Thomas
dc.contributor.imecauthorVanfleteren, Jan
dc.contributor.imecauthorGonzalez, Mario
dc.contributor.orcidimecBossuyt, Frederick::0000-0003-3350-9295
dc.contributor.orcidimecVanfleteren, Jan::0000-0002-9654-7304
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage143
dc.source.endpage154
dc.source.journalMicroelectronics Reliability
dc.source.issue1
dc.source.volume55
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S0026271414003898
imec.availabilityPublished - open access


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