Authors

Jablonski, Michal; Lucchini, R.; Bossuyt, Frederick; Vervust, Thomas; Vanfleteren, Jan; De Vries, J.W.C.; Vena, P.; Gonzalez, Mario

ISSN

0026-2714

Issue

1

Journal

Microelectronics Reliability

Volume

55

Title

Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatique reliability

Publication type

Journal article

Embargo date

9999-12-31