dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Chiarella, Thomas | |
dc.contributor.author | Horiguchi, Naoto | |
dc.contributor.author | Grasser, Tibor | |
dc.date.accessioned | 2021-10-22T20:00:01Z | |
dc.date.available | 2021-10-22T20:00:01Z | |
dc.date.issued | 2015 | |
dc.identifier.issn | 0741-3106 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25446 | |
dc.source | IIOimport | |
dc.title | Extraction of the random component of time-dependent variability using matched pairs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Chiarella, Thomas | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.contributor.orcidimec | Chiarella, Thomas::0000-0002-6155-9030 | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 300 | |
dc.source.endpage | 302 | |
dc.source.journal | IEEE Electron Device Letters | |
dc.source.issue | 4 | |
dc.source.volume | 36 | |
dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7042778 | |
imec.availability | Published - open access | |