dc.contributor.author | Nabiollahi, Nabi | |
dc.contributor.author | Moelans, Nele | |
dc.contributor.author | Gonzalez, Mario | |
dc.contributor.author | De Messemaeker, Joke | |
dc.contributor.author | Wilson, Chris | |
dc.contributor.author | Croes, Kristof | |
dc.contributor.author | Beyne, Eric | |
dc.contributor.author | De Wolf, Ingrid | |
dc.date.accessioned | 2021-10-22T21:18:15Z | |
dc.date.available | 2021-10-22T21:18:15Z | |
dc.date.issued | 2015 | |
dc.identifier.issn | 0026-2714 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25679 | |
dc.source | IIOimport | |
dc.title | Microstructure simulation of grain growth in Cu through silicon vias using phase-field modeling | |
dc.type | Journal article | |
dc.contributor.imecauthor | Gonzalez, Mario | |
dc.contributor.imecauthor | De Messemaeker, Joke | |
dc.contributor.imecauthor | Wilson, Chris | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.imecauthor | De Wolf, Ingrid | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 765 | |
dc.source.endpage | 770 | |
dc.source.journal | Microelectronics Reliability | |
dc.source.issue | 5 | |
dc.source.volume | 55 | |
dc.identifier.url | http://www.sciencedirect.com/science/article/pii/S0026271415000293 | |
imec.availability | Published - imec | |