Show simple item record

Edge-enhanced Raman scattering in narrow sGe fin field-effect transistor channels

dc.contributor.authorNuytten, Thomas
dc.contributor.authorHantschel, Thomas
dc.contributor.authorKosemura, Daisuke
dc.contributor.authorSchulze, Andreas
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-22T21:25:12Z
dc.date.available2021-10-22T21:25:12Z
dc.date.issued2015
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25697
dc.sourceIIOimport
dc.titleEdge-enhanced Raman scattering in narrow sGe fin field-effect transistor channels
dc.typeJournal article
dc.contributor.imecauthorNuytten, Thomas
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecNuytten, Thomas::0000-0002-5921-6928
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.source.peerreviewyes
dc.source.beginpage33107
dc.source.journalApplied Physics Letters
dc.source.issue3
dc.source.volume106
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/apl/106/3/10.1063/1.4906537
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record