dc.contributor.author | Rossetto, Isabella | |
dc.contributor.author | Meneghini, Matteo | |
dc.contributor.author | Bisi, Davide | |
dc.contributor.author | Barbato, A | |
dc.contributor.author | Van Hove, Marleen | |
dc.contributor.author | Marcon, Denis | |
dc.contributor.author | Wu, Tian-Li | |
dc.contributor.author | Decoutere, Stefaan | |
dc.contributor.author | Meneghesso, Gaudio | |
dc.contributor.author | Zanoni, Enrico | |
dc.date.accessioned | 2021-10-22T22:23:42Z | |
dc.date.available | 2021-10-22T22:23:42Z | |
dc.date.issued | 2015 | |
dc.identifier.issn | 0026-2714 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25839 | |
dc.source | IIOimport | |
dc.title | Impact of gate insulator on the dc and dynamic performance of AlGaN/GaN MIS-HEMTs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Marcon, Denis | |
dc.contributor.imecauthor | Decoutere, Stefaan | |
dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1692 | |
dc.source.endpage | 1696 | |
dc.source.journal | Microelectronics Reliability | |
dc.source.issue | 9_10 | |
dc.source.volume | 55 | |
dc.identifier.url | http://www.sciencedirect.com/science/article/pii/S0026271415300780 | |
imec.availability | Published - imec | |
imec.internalnotes | Ppaer ESREF 2015 | |