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Charge collection mechanisms of Ge-channel bulk pMOSFETs

dc.contributor.authorSamsel, Isaak
dc.contributor.authorZhang, E.X.
dc.contributor.authorSternberg, A.L.
dc.contributor.authorNi, K.
dc.contributor.authorReed, Robert
dc.contributor.authorFleedwood, Daniel
dc.contributor.authorAlles, M.L.
dc.contributor.authorSchrimpf, R.D.
dc.contributor.authorLinten, Dimitri
dc.contributor.authorMitard, Jerome
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorCollaert, Nadine
dc.date.accessioned2021-10-22T22:31:05Z
dc.date.available2021-10-22T22:31:05Z
dc.date.issued2015
dc.identifier.issn0018-9499
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25857
dc.sourceIIOimport
dc.titleCharge collection mechanisms of Ge-channel bulk pMOSFETs
dc.typeJournal article
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage2725
dc.source.endpage2731
dc.source.journalIEEE Transactions on Nuclear Science
dc.source.issue6
dc.source.volume62
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7348810
imec.availabilityPublished - open access
imec.internalnotesPaper from Nuclear and Space Radiation Effects Conference - NSREC


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