Show simple item record

Towards single-trap spectroscopy: generation-recombination noise in UTBOX SOI nMOSFETs

dc.contributor.authorSimoen, Eddy
dc.contributor.authorCretu, Bogdan
dc.contributor.authorFang, Wen
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorRoutoure, Jean-Marc
dc.contributor.authorCarin, Regis
dc.contributor.authordos Santos, Sara
dc.contributor.authorLuo, Jun
dc.contributor.authorZhao, Chao
dc.contributor.authorMartino, Joao Martino
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-22T22:54:13Z
dc.date.available2021-10-22T22:54:13Z
dc.date.issued2015
dc.identifier.issn1610-1634
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25910
dc.sourceIIOimport
dc.titleTowards single-trap spectroscopy: generation-recombination noise in UTBOX SOI nMOSFETs
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage292
dc.source.endpage298
dc.source.journalPhysica Status Solidi C
dc.source.issue3
dc.source.volume12
dc.identifier.urlhttp://onlinelibrary.wiley.com/doi/10.1002/pssc.201400075/abstract
imec.availabilityPublished - open access
imec.internalnotesSpecial Issue: E-MRS 2014 Spring Meeting � Symposium H: ALTECH 2014


Files in this item

Thumbnail
Name:
31679.pdf
Size:
1.050Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record