dc.contributor.author | Vais, Abhitosh | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Lin, Dennis | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Mocuta, Anda | |
dc.contributor.author | De Meyer, Kristin | |
dc.contributor.author | Thean, Aaron | |
dc.date.accessioned | 2021-10-22T23:48:47Z | |
dc.date.available | 2021-10-22T23:48:47Z | |
dc.date.issued | 2015 | |
dc.identifier.issn | 0003-6951 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26026 | |
dc.source | IIOimport | |
dc.title | Impact of starting measurement voltage relative to flat-band voltage position on the capacitance-voltage hysteresis and on the defect characterization of InGaAs/high-k metal-oxide-semiconductor stacks | |
dc.type | Journal article | |
dc.contributor.imecauthor | Vais, Abhitosh | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Lin, Dennis | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.orcidimec | Vais, Abhitosh::0000-0002-0317-7720 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 223504 | |
dc.source.journal | Applied Physics Letters | |
dc.source.issue | 22 | |
dc.source.volume | 107 | |
dc.identifier.url | http://scitation.aip.org/content/aip/journal/apl/107/22/10.1063/1.4936991 | |
imec.availability | Published - open access | |