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Temperature dependence of frequency dispersion in III–V metal-oxide-semiconductor C-V and the capture/emission process of border traps

dc.contributor.authorVais, Abhitosh
dc.contributor.authorLin, Dennis
dc.contributor.authorDou, Chunmeng
dc.contributor.authorMartens, Koen
dc.contributor.authorIvanov, Tsvetan
dc.contributor.authorXie, Qi
dc.contributor.authorTang, Fu
dc.contributor.authorGivens, Michael
dc.contributor.authorMaes, Jan
dc.contributor.authorCollaert, Nadine
dc.contributor.authorRaskin, Jean-Pierre
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-22T23:49:20Z
dc.date.available2021-10-22T23:49:20Z
dc.date.issued2015
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26027
dc.sourceIIOimport
dc.titleTemperature dependence of frequency dispersion in III–V metal-oxide-semiconductor C-V and the capture/emission process of border traps
dc.typeJournal article
dc.contributor.imecauthorVais, Abhitosh
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorIvanov, Tsvetan
dc.contributor.imecauthorXie, Qi
dc.contributor.imecauthorGivens, Michael
dc.contributor.imecauthorMaes, Jan
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecVais, Abhitosh::0000-0002-0317-7720
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecIvanov, Tsvetan::0000-0003-3407-2742
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage53504
dc.source.journalApplied Physics Letters
dc.source.issue5
dc.source.volume107
imec.availabilityPublished - imec


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