Show simple item record

Quantum efficiency and dark current evaluation of a backside illuminated CMOS image sensor

dc.contributor.authorVereecke, Bart
dc.contributor.authorCavaco, Celso
dc.contributor.authorDe Munck, Koen
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorMinoglou, Kiki
dc.contributor.authorMoore, George
dc.contributor.authorSabuncuoglu Tezcan, Deniz
dc.contributor.authorTack, Klaas
dc.contributor.authorWu, Bob
dc.contributor.authorOsman, Haris
dc.date.accessioned2021-10-23T00:35:37Z
dc.date.available2021-10-23T00:35:37Z
dc.date.issued2015
dc.identifier.issn0021-4922
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26126
dc.sourceIIOimport
dc.titleQuantum efficiency and dark current evaluation of a backside illuminated CMOS image sensor
dc.typeJournal article
dc.contributor.imecauthorVereecke, Bart
dc.contributor.imecauthorCavaco, Celso
dc.contributor.imecauthorDe Munck, Koen
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.imecauthorSabuncuoglu Tezcan, Deniz
dc.contributor.imecauthorTack, Klaas
dc.contributor.imecauthorOsman, Haris
dc.contributor.orcidimecCavaco, Celso::0000-0001-9079-338X
dc.contributor.orcidimecSabuncuoglu Tezcan, Deniz::0000-0002-9237-7862
dc.date.embargo9999-12-31
dc.identifier.doi10.7567/JJAP.54.04DE09
dc.source.peerreviewyes
dc.source.beginpage04DE09
dc.source.journalJapanese Journal of Applied Physics
dc.source.volume54
dc.identifier.urlhttp://iopscience.iop.org/article/10.7567/JJAP.54.04DE09/meta
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
33056.pdf
Size:
1.236Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record