dc.contributor.author | Xu, Blair | |
dc.contributor.author | Hantschel, Thomas | |
dc.contributor.author | Tsigkourakos, Menelaos | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2021-10-23T01:16:00Z | |
dc.date.available | 2021-10-23T01:16:00Z | |
dc.date.issued | 2015 | |
dc.identifier.issn | 1862-6300 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26205 | |
dc.source | IIOimport | |
dc.title | Scanning spreading resistance microscopy for the electrical characterization of diamond interfacial layers | |
dc.type | Journal article | |
dc.contributor.imecauthor | Hantschel, Thomas | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Hantschel, Thomas::0000-0001-9476-4084 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 2578 | |
dc.source.endpage | 2582 | |
dc.source.journal | Physica Status Solidi A | |
dc.source.issue | 11 | |
dc.source.volume | 212 | |
dc.identifier.url | http://onlinelibrary.wiley.com/doi/10.1002/pssa.201532234/abstract | |
imec.availability | Published - imec | |