dc.contributor.author | Yakimets, Dmitry | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Schuddinck, Pieter | |
dc.contributor.author | Huynh Bao, Trong | |
dc.contributor.author | Garcia Bardon, Marie | |
dc.contributor.author | Raghavan, Praveen | |
dc.contributor.author | Veloso, Anabela | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Mercha, Abdelkarim | |
dc.contributor.author | Verkest, Diederik | |
dc.contributor.author | Thean, Aaron | |
dc.contributor.author | De Meyer, Kristin | |
dc.date.accessioned | 2021-10-23T01:19:00Z | |
dc.date.available | 2021-10-23T01:19:00Z | |
dc.date.issued | 2015 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26211 | |
dc.source | IIOimport | |
dc.title | Vertical GAAFETs for the ultimate CMOS scaling | |
dc.type | Journal article | |
dc.contributor.imecauthor | Yakimets, Dmitry | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.imecauthor | Schuddinck, Pieter | |
dc.contributor.imecauthor | Garcia Bardon, Marie | |
dc.contributor.imecauthor | Veloso, Anabela | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Mercha, Abdelkarim | |
dc.contributor.imecauthor | Verkest, Diederik | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.contributor.orcidimec | Mercha, Abdelkarim::0000-0002-2174-6958 | |
dc.contributor.orcidimec | Verkest, Diederik::0000-0001-6567-2746 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1433 | |
dc.source.endpage | 1439 | |
dc.source.journal | IEEE Transactions on Electron Devices | |
dc.source.issue | 5 | |
dc.source.volume | 62 | |
dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7078860 | |
imec.availability | Published - open access | |