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dc.contributor.authorYakimets, Dmitry
dc.contributor.authorEneman, Geert
dc.contributor.authorSchuddinck, Pieter
dc.contributor.authorHuynh Bao, Trong
dc.contributor.authorGarcia Bardon, Marie
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorVeloso, Anabela
dc.contributor.authorCollaert, Nadine
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorVerkest, Diederik
dc.contributor.authorThean, Aaron
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-23T01:19:00Z
dc.date.available2021-10-23T01:19:00Z
dc.date.issued2015
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26211
dc.sourceIIOimport
dc.titleVertical GAAFETs for the ultimate CMOS scaling
dc.typeJournal article
dc.contributor.imecauthorYakimets, Dmitry
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorSchuddinck, Pieter
dc.contributor.imecauthorGarcia Bardon, Marie
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorThean, Aaron
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1433
dc.source.endpage1439
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue5
dc.source.volume62
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7078860
imec.availabilityPublished - open access


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