dc.contributor.author | Belmonte, Attilio | |
dc.contributor.author | Fantini, Andrea | |
dc.contributor.author | Redolfi, Augusto | |
dc.contributor.author | Houssa, Michel | |
dc.contributor.author | Jurczak, Gosia | |
dc.contributor.author | Goux, Ludovic | |
dc.date.accessioned | 2021-10-23T10:06:44Z | |
dc.date.available | 2021-10-23T10:06:44Z | |
dc.date.issued | 2016 | |
dc.identifier.issn | 0038-1101 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26333 | |
dc.source | IIOimport | |
dc.title | Impact of temperature and programming method on the data retention of Cu/Al2O3-based conductive-bridge RAM operated at low-current (10 $lA) | |
dc.type | Journal article | |
dc.contributor.imecauthor | Belmonte, Attilio | |
dc.contributor.imecauthor | Fantini, Andrea | |
dc.contributor.imecauthor | Redolfi, Augusto | |
dc.contributor.imecauthor | Houssa, Michel | |
dc.contributor.imecauthor | Jurczak, Gosia | |
dc.contributor.imecauthor | Goux, Ludovic | |
dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 189 | |
dc.source.endpage | 197 | |
dc.source.journal | Solid-State Electronics | |
dc.source.volume | 125 | |
dc.identifier.url | http://www.sciencedirect.com/science/article/pii/S003811011630096X | |
imec.availability | Published - open access | |