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Assessing Bias-Temperature Instabilities and Self-Heating Effects in Advanced Semiconductor Nodes

dc.contributor.authorBury, Erik
dc.date.accessioned2021-10-23T10:10:53Z
dc.date.available2021-10-23T10:10:53Z
dc.date.issued2016-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26384
dc.sourceIIOimport
dc.titleAssessing Bias-Temperature Instabilities and Self-Heating Effects in Advanced Semiconductor Nodes
dc.typePHD thesis
dc.contributor.imecauthorBury, Erik
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.contributor.thesisadvisorGroeseneken, Guido
dc.identifier.urlhttps://limo.libis.be/primo-explore/fulldisplay?docid=LIRIAS1733152&context=L&vid=Lirias&search_scope=Lirias&tab=default_tab&lang=en_US&fromSitemap=1
imec.availabilityPublished - open access


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