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dc.contributor.authorCelano, Umberto
dc.contributor.authorGiammaria, Guido
dc.contributor.authorGoux, Ludovic
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorJurczak, Gosia
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-23T10:13:09Z
dc.date.available2021-10-23T10:13:09Z
dc.date.issued2016
dc.identifier.issn2040-3364
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26406
dc.sourceIIOimport
dc.titleNanoscopic structural rearrangements of the Cu-filament in conductive-bridge memories
dc.typeJournal article
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage13915
dc.source.endpage13923
dc.source.journalNanoscale
dc.source.issue29
dc.source.volume8
dc.identifier.urlhttp://pubs.rsc.org/en/content/articlelanding/2016/nr/c5nr08735j#!divAbstract
imec.availabilityPublished - open access


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