Metrology and physical mechanisms in new generation ionic devices
dc.contributor.author | Celano, Umberto | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2021-10-23T10:13:42Z | |
dc.date.available | 2021-10-23T10:13:42Z | |
dc.date.issued | 2016 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26411 | |
dc.source | IIOimport | |
dc.title | Metrology and physical mechanisms in new generation ionic devices | |
dc.type | Book | |
dc.contributor.imecauthor | Celano, Umberto | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Celano, Umberto::0000-0002-2856-3847 | |
dc.source.peerreview | no | |
dc.identifier.url | http://www.springer.com/us/book/9783319395302 | |
imec.availability | Published - imec | |
imec.internalnotes | ISBN 978-3-319-39531-9 |
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