Show simple item record

Model for the current-voltage characteristics of ultrathin gate oxides after soft breakdown

dc.contributor.authorHoussa, Michel
dc.contributor.authorNigam, Tanya
dc.contributor.authorMertens, Paul
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-09-30T12:13:44Z
dc.date.available2021-09-30T12:13:44Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2641
dc.sourceIIOimport
dc.titleModel for the current-voltage characteristics of ultrathin gate oxides after soft breakdown
dc.typeJournal article
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorMertens, Paul
dc.contributor.imecauthorHeyns, Marc
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage4351
dc.source.endpage4355
dc.source.journalJournal of Applied Physics
dc.source.issue8
dc.source.volume84
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
2577.pdf
Size:
111.2Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record