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Novel flexible and cost-effective retention assessment method for TMO-based RRAM

dc.contributor.authorChen, Michael
dc.contributor.authorFantini, Andrea
dc.contributor.authorGoux, Ludovic
dc.contributor.authorGorine, Georgi
dc.contributor.authorRedolfi, Augusto
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorJurczak, Gosia
dc.date.accessioned2021-10-23T10:15:38Z
dc.date.available2021-10-23T10:15:38Z
dc.date.issued2016
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26427
dc.sourceIIOimport
dc.titleNovel flexible and cost-effective retention assessment method for TMO-based RRAM
dc.typeJournal article
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorRedolfi, Augusto
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1112
dc.source.endpage1115
dc.source.journalIEEE Electron Device Letters
dc.source.issue9
dc.source.volume37
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7506001/
imec.availabilityPublished - open access


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