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Insights into the nanoscale lateral and vertical phase separation in organic bulk heterojunctions via scanning probe microscopy

dc.contributor.authorChintala, Ravi Chandra
dc.contributor.authorTait, Jeffrey
dc.contributor.authorEyben, Pierre
dc.contributor.authorVoroshazi, Eszter
dc.contributor.authorSurana, Supriya
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorConard, Thierry
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-23T10:18:24Z
dc.date.available2021-10-23T10:18:24Z
dc.date.issued2016
dc.identifier.issn2040-3364
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26448
dc.sourceIIOimport
dc.titleInsights into the nanoscale lateral and vertical phase separation in organic bulk heterojunctions via scanning probe microscopy
dc.typeJournal article
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorVoroshazi, Eszter
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.source.peerreviewyes
dc.source.beginpage3629
dc.source.endpage3637
dc.source.journalNanoscale
dc.source.issue6
dc.source.volume8
dc.identifier.urlhttp://pubs.rsc.org/en/content/articlelanding/2016/nr/c5nr08765a#!divAbstract
imec.availabilityPublished - imec


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