dc.contributor.author | Claeys, Cor | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Ni, Kai | |
dc.contributor.author | Hikavyy, Andriy | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | Gupta, Somya | |
dc.contributor.author | Merckling, Clement | |
dc.contributor.author | Alian, AliReza | |
dc.contributor.author | Caymax, Matty | |
dc.date.accessioned | 2021-10-23T10:20:16Z | |
dc.date.available | 2021-10-23T10:20:16Z | |
dc.date.issued | 2016 | |
dc.identifier.issn | 2162-8769 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26461 | |
dc.source | IIOimport | |
dc.title | Device assessment of electrically active defects in high-mobility materials | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.imecauthor | Hikavyy, Andriy | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Merckling, Clement | |
dc.contributor.imecauthor | Alian, AliReza | |
dc.contributor.imecauthor | Caymax, Matty | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.contributor.orcidimec | Hikavyy, Andriy::0000-0002-8201-075X | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | Merckling, Clement::0000-0003-3084-2543 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | P3149 | |
dc.source.endpage | 3165 | |
dc.source.journal | ECS Journal of Solid State Science and Technology | |
dc.source.issue | 4 | |
dc.source.volume | 5 | |
dc.identifier.url | http://jss.ecsdl.org/content/5/4/P3149.abstract | |
imec.availability | Published - open access | |