Show simple item record

Assessment of DC and low frequency noise performances of triple-gate FinFETs at cryogenic temperatures

dc.contributor.authorCretu, Bogdan
dc.contributor.authorBoudier, Dimitri
dc.contributor.authorSimoen, Eddy
dc.contributor.authorVeloso, Anabela
dc.contributor.authorCollaert, Nadine
dc.date.accessioned2021-10-23T10:23:33Z
dc.date.available2021-10-23T10:23:33Z
dc.date.issued2016
dc.identifier.issn0268-1242
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26483
dc.sourceIIOimport
dc.titleAssessment of DC and low frequency noise performances of triple-gate FinFETs at cryogenic temperatures
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewyes
dc.source.beginpage124006
dc.source.journalSemiconductor Science and Technology
dc.source.issue12
dc.source.volume31
dc.identifier.urlhttp://iopscience.iop.org/article/10.1088/0268-1242/31/12/124006
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record