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3-D technology: failure analysis challenges

dc.contributor.authorDe Wolf, Ingrid
dc.date.accessioned2021-10-23T10:30:00Z
dc.date.available2021-10-23T10:30:00Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26522
dc.sourceIIOimport
dc.title3-D technology: failure analysis challenges
dc.typeJournal article
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.source.peerreviewno
dc.source.beginpage24
dc.source.endpage29
dc.source.journalEDFA Magazine (Electronic Device Failure Analysis)
dc.source.issue4
dc.source.volume18
imec.availabilityPublished - imec


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