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Carrier lifetime spectrocopy for defect characterization in semiconductor materials and devices

dc.contributor.authorGaubas, Eugenijus
dc.contributor.authorSimoen, Eddy
dc.contributor.authorVanhellemont, Jan
dc.date.accessioned2021-10-23T10:55:26Z
dc.date.available2021-10-23T10:55:26Z
dc.date.issued2016
dc.identifier.issn2162-8769
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26642
dc.sourceIIOimport
dc.titleCarrier lifetime spectrocopy for defect characterization in semiconductor materials and devices
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpageP3108
dc.source.endpageP3137
dc.source.journalECS Journal of Solid State Science and Technology
dc.source.issue4
dc.source.volume5
dc.identifier.urlhttp://jss.ecsdl.org/content/5/4/P3108.short
imec.availabilityPublished - open access


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