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Quantitative analysis of TM lateral leakage in foundry fabricated silicon rib waveguides

dc.contributor.authorHope, A.
dc.contributor.authorNguyen, T.G.
dc.contributor.authorMitchell, A.
dc.contributor.authorBogaerts, Wim
dc.date.accessioned2021-10-23T11:18:46Z
dc.date.available2021-10-23T11:18:46Z
dc.date.issued2016
dc.identifier.issn1041-1135
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26734
dc.sourceIIOimport
dc.titleQuantitative analysis of TM lateral leakage in foundry fabricated silicon rib waveguides
dc.typeJournal article
dc.contributor.imecauthorBogaerts, Wim
dc.contributor.orcidimecBogaerts, Wim::0000-0003-1112-8950
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage493
dc.source.endpage496
dc.source.journalIEEE Photonics Technology Letters
dc.source.issue4
dc.source.volume28
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7328266
imec.availabilityPublished - open access


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