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On the identification of buffer trapping for bias-dependent RON instability of AlGaN/GaN schottky barrier diode with AlGaN:C back barrier

dc.contributor.authorHu, Jie
dc.contributor.authorStoffels, Steve
dc.contributor.authorLenci, Silvia
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-23T11:22:52Z
dc.date.available2021-10-23T11:22:52Z
dc.date.issued2016
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26748
dc.sourceIIOimport
dc.titleOn the identification of buffer trapping for bias-dependent RON instability of AlGaN/GaN schottky barrier diode with AlGaN:C back barrier
dc.typeJournal article
dc.contributor.imecauthorStoffels, Steve
dc.contributor.imecauthorLenci, Silvia
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewyes
dc.source.beginpage310
dc.source.endpage313
dc.source.journalIEEE Electron Device Letters
dc.source.issue3
dc.source.volume37
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7370893
imec.availabilityPublished - imec


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