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Guest editors' introduction: Robust 3-D stacked ICs

dc.contributor.authorKhursheed, Saqib
dc.contributor.authorVivet, Pascal
dc.contributor.authorHopsch, Fabian
dc.contributor.authorMarinissen, Erik Jan
dc.date.accessioned2021-10-23T11:46:30Z
dc.date.available2021-10-23T11:46:30Z
dc.date.issued2016-05
dc.identifier.issn0740-7475
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26827
dc.sourceIIOimport
dc.titleGuest editors' introduction: Robust 3-D stacked ICs
dc.typeJournal article
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewno
dc.source.beginpage6
dc.source.endpage7
dc.source.journalIEEE Design & Test
dc.source.issue3
dc.source.volume33
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7462359
imec.availabilityPublished - imec


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