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Backscattering in silicon microring resonators: a quantitative analysis

dc.contributor.authorLi, Ang
dc.contributor.authorVan Vaerenbergh, Thomas
dc.contributor.authorDe Heyn, Peter
dc.contributor.authorBienstman, Peter
dc.contributor.authorBogaerts, Wim
dc.date.accessioned2021-10-23T12:09:49Z
dc.date.available2021-10-23T12:09:49Z
dc.date.issued2016-05
dc.identifier.issn1863-8880
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26898
dc.sourceIIOimport
dc.titleBackscattering in silicon microring resonators: a quantitative analysis
dc.typeJournal article
dc.contributor.imecauthorDe Heyn, Peter
dc.contributor.imecauthorBienstman, Peter
dc.contributor.imecauthorBogaerts, Wim
dc.contributor.orcidimecDe Heyn, Peter::0000-0003-3523-7377
dc.contributor.orcidimecBienstman, Peter::0000-0001-6259-464X
dc.contributor.orcidimecBogaerts, Wim::0000-0003-1112-8950
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage420
dc.source.endpage431
dc.source.journalLaser & Photonics Reviews
dc.source.issue3
dc.source.volume10
dc.identifier.urlhttp://onlinelibrary.wiley.com/doi/10.1002/lpor.201500207/abstract
imec.availabilityPublished - open access


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