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Effect of the Sample Topology on Superconducting Critical Parameters

dc.contributor.authorMoschalkov, V. V.
dc.contributor.authorGielen, L.
dc.contributor.authorStrunk, C.
dc.contributor.authorJonckheere, Rik
dc.contributor.authorQiu, Xing Zhi
dc.contributor.authorVan Haesendonck, Chris
dc.contributor.authorBruynseraede, Y.
dc.date.accessioned2021-09-29T12:44:18Z
dc.date.available2021-09-29T12:44:18Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/268
dc.sourceIIOimport
dc.titleEffect of the Sample Topology on Superconducting Critical Parameters
dc.typeJournal article
dc.contributor.imecauthorJonckheere, Rik
dc.contributor.orcidimecJonckheere, Rik::0000-0003-2211-9443
dc.source.peerreviewno
dc.source.beginpage2513
dc.source.endpage2514
dc.source.journalPhysica C
dc.source.volume235
imec.availabilityPublished - imec
imec.internalnotesProceedings of the Int. Conference on Materials and Mechanisms of Superconductivity. High Temperature Superconductors IV. Grenoble, July 4-9, 1994.


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